New magnetometry techniques based on Nitrogen-Vacancy (NV) defects in diamondallow for the imaging of static (DC) and oscillatory (AC) nanoscopic magneticsystems. However, these techniques require accurate knowledge and control ofthe sample dynamics, and are thus limited in their ability to image fieldsarising from rapidly fluctuating (FC) environments. We show here that FC fieldsplace restrictions on the DC field sensitivity of an NV qubit magnetometer, andthat by probing the dephasing rate of the qubit in a magnetic FC environment,we are able to measure fluctuation rates and RMS field strengths that would beotherwise inaccessible with the use of DC and AC magnetometry techniques. FCsensitivities are shown to be comparable to those of AC fields, whilstrequiring no additional experimental overheads or control over the sample.
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